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JTAG Manager
with Operator Fault Spotlight Tool OFSTM and ICT Viewer ICTVTM Tools

Unleash Your JTAG Test Management!


We're proud to feature JTAG Manager, a product designed to provide all users — experienced or new to JTAG — an opportunity to see firsthand the benefits of using JTAG to test & debug on any platform.
Getting started with JTAG tools has never been so convenient!

JTAG Manager is the PC-based operational multi-language (English, Russian, Chinese) envelope (patent pending) that intended for implementation on the OEM electronic board manufacturing facilities, contract manufacturers and/or in the R&D labs. Featuring unprecedented versatility which combines various JTAG Runners with the fault diagnostic support, the JTAG Manager operational envelope is intended to work with the following JTAG vendor software tools:

  •   Corelis' ScanExpress
  •       
  •   JTAG Technologies' ProVision
  •     
  •   Flynn Systems' onTAP Series 4000
  •     
  •   Asset' ScanWorks
  •     
  •   Goepel' CASCON
  •     
  •   XJTAG's XJRunner
  •     

JTAG Manager Main Features:

  • Easy-to-use graphical test sequencer that executes independent test steps or in any sequence
  • Pinpoints manufacturing defects down to the net and pin level
  • Easy-to-use streamlined Graphical User Interface
  • Programs Flash and other programmable devices (CPLD, FPGA, etc.)
  • Integrated Advanced Diagnostics Tools that provide detailed fault report logs and proximity diagnostics
  • Special interface for JTAG test integration with console based functional test execution systems

All relevant data contains in specifically designed JTAG Manager Data Base that consists the complete information and handling tools for both hardware (assembly) versions of each board-under-test (BUT) and firmware (code) releases. The JTAG Manager have simple and friendly operator oriented GUI both for project and board selection and for hardware and software/firmware release selection. The JTAG Manager is intended for use in any production process of electronic boards and systems that are developed according to the well-known Boundary-Scan (JTAG) technologies: IEEE 1149.1 (Digital) and IEEE 1149.6 (Advanced). The JTAG Manager can be implemented both for separate boards and for entire system. When the JTAG Manager is in usage, there is no need to use neither Automated Test Equipment (ATE) GUI of the vendors mentioned above nor standalone ISP GUI for the CPLD/FPGA/Flash devices programming.

Fault Diagnostics & Pinpoint

Fault Diagnostics & Pinpoint

Highlighting Any Net & Device

Highlighting Any Net & Device

The Operator Fault Spotlight (OFS) is a powerful graphical fault highlighting tool built-in into the JTAG Manager and provides the ability to visually pinpoint the possible fault locations on a BUT layout view. After running JTAG tests, the possible fault location can be viewed by clicking the net name or pin number in the net failures and diagnostic report.

The BUT picture is generated automatically from any CAD files. When activated, the OFS opens a separate window with the BUT picture. The BUT window is equipped with four buttons for the picture zoom in/out, fit window and flip the BUT image, so the test operator can see both print side and component side of the BUT.

After the JTAG test failed, any JTAG Test platform diagnostic results are displayed in the OFS Diagnostic Info window. Both faulty net names and possible faulty pin names got displayed in this window as hyperlinks. When clicking a hyperlink, the corresponding net and device(s) are highlighted on the BUT for the test operator convenience.

Diagnostic Fault Location in the OFS Window

Diagnostic Fault Location in the OFS Window

The ICT Viewer (ICTV), the part of the JTAG Manager, is built as a unique and powerful graphical tool (see picture below) for highlight the elements of the Diagnostic Info window A (faulty device reference name and the faulty net name), as well as info of the ICT Nails List in window B (ICT nail name and the type of the ICT pad), and pinpoint them on the board-under-test schematics (window C) and on the board-under-test layout view (window D), on both sides of the board.

Highlighting ICT Pad & Nail Diameter in the ICT Viewer Window

Highlighting faulty elements and nets, ICT pads & their nail types in the ICT Viewer Window





 
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