ICT Test Development
StarTest provides turn-key test program development services for the Teradyne Z18xx family of In-Circuit Testers. Our team of experienced test engineers provides ICT test programs with highest fault coverage and fast cycle time. Our test engineers have successfully completed dozens of the In-Circuit test projects for a broad range of customers and industries. Meeting our customerÓ³ expectation and on-time delivery of each project has been the basis of our services.
Our ICT Services
Standard Z18xx Test Program Development
The standard Z18xx ICT test programs are cost effective and offer a fast turnaround. This service is most suitable for customers with standard technologies or limited time and budget.
On-board Programming of CPLD and FLASH devices
The CPLD devices (Altera, Lattice, Xilinx, etc.) on-board (in-circuit) programming or configuration using STAPL (JBC), or Serial Vector Format (SVF), or VME files and external DOS programs for executing these files. Virtual execution is controlled by the test program.
The FLASH devices on-board programming using Digital Functional Processor (DFP).
User-oriented Z1800 Test Program Development
The user-oriented or advanced Z18xx ICT test programs are designed for complex boards and for customers that require the maximum fault coverage possible at the ICT stage. These programs include all the steps listed in the standard service as well as the following steps (if applicable):
|Site map | About Us | Solutions | Products | StarTest Library | Partners and Customers | Support | Monograph|
All rights reserved