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Продолжается публикация в московском журнале "Производство электроники" цикла статей "Основы технологии граничного сканирования и тестопригодного проектирования"


Upcoming scheduled classes in the High-Tech College (Herzlia, Israel)

Course No. 369   Design-For-Testability and Boundary-Scan (JTAG) Technologies
(5 days) - February 22, 2009
(5 days) - June 7, 2009

Course No. 368   DFT & JTAG Standards: Digital and Analog
(3 days) - April 5, 2009

Course No. 4890   DFT and JTAG Standards: Digital and Analog
(1 day) - March 29, 2009