 |
EXPERIENCED TEST EXPERTS
JTAG Test DevelopmentICT Test DevelopmentDesign-For-TestabilityBSDL Silicon ValidationRegulatory Consulting
JTAG External Modules (JEM_DIMM/SODIMM) for the DDR2/DDR3 Memory Socket TestJTAG External Modules (JEMIO) for Cluster TestJTAG Remote Monitor JSpyTAP Distributor Tool (TAP-Di)Operator Fault Spotlight Tool (OFS)JTAG ManagerDFT ManagerBridge-For-Testability Tool
STARTEST web site mapStarTest specializes in the thorough understanding of the customer's needs
|
StarTest News
12.02.2010New company logo and new web site release.
Dr. JTAG Monthly Focus
August 8 and November 7, 2010“Design-For-Testability & Boundary-Scan (JTAG) Technologies»
Course No. 369 in the High-Tech College Herzlia, 5 days. The course 369 syllabus.
October 31, 2010“DFT & JTAG Standards — Digital and Analog” Course No. 368 in the High-Tech College Herzlia,
3 days. The course 368 syllabus.
November 14, 2010“JTAG Technology & DFT Basics” Course No. 4890 in the High-Tech College Herzlia,
1 day. The course 4890 syllabus.
Flynn Systems debuts HW cluster toolsFlynn Systems has augmented its hardware line with the introduction of the StarTest JEM_DIMM/SODIMM modules family.
| Site map | About Us | Solutions | Products | StarTest University | Partners and Customers | Support | Contact Us | |
| Contact Webmaster |
© StarTest. All rights reserved |