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JTAG Test Development
ICT Test Development
Design-For-Testability
BSDL Silicon Validation
Regulatory Consulting
JTAG External Modules (JEM_DIMM/SODIMM) for the DDR2/DDR3 Memory Socket Test
JTAG External Modules (JEMIO) for Cluster Test
JTAG Remote Monitor JSpy
TAP Distributor Tool (TAP-Di)
Operator Fault Spotlight Tool (OFS)
JTAG Manager
DFT Manager
Bridge-For-Testability Tool
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Test News Worldwide
Partners and Customers
Some Success Stories & Testimonies
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Test News Worldwide
Recommended Web Links:
JTAG.TECT (Russian web site) —
http://www.jtag-test.ru
IEEE 1500 Embedded Core Test —
http://grouper.ieee.org/groups/1500/
IEEE Design & Test —
http://www.computer.org/portal/site/design
Scanseer —
http://www.scanseer.com/?gclid=CK-WkOyCyo4CFQxWZwodIGevAQ
JTAG Toolkit —
http://www.jtag.tk
Asset InterTech —
http://www.asset-intertech.com/products/free_resources.htm
Asset BSDL Validation —
http://www.asset-intertech.com/bsdl_service
Corelis —
http://www.corelis.com
Goepel Electronic —
http://www.goepel.com/content/html_en/index.php?site=bs_tutorial&level1=scan&level2=bs_tutorial&level3
JTAG Technologies —
http://www.jtag.com/main.php?cm=p8_1___2
Flynn Systems —
http://www.flynn.com/products/ontap.php?PHPSESSID=ab53a7b4f3e5480e513248ffba482c2c
Bennetts Associates —
http://www.dft.co.uk/other-links.html
ATE World —
http://www.ateworld.com/home_pages/news_release_archive.cfm
Acculogic —
http://www.acculogic.com
Intellitech —
http://www.intellitech.com
XJTAG —
http://www.xjtag.com/jtag.php
DirectInsight —
http://www.directinsight.co.uk/function/boundary-scan-jtag.html
ElectronicsTalk —
http://www.electronicstalk.com/guides/jtag.html
MentorGraphics —
http://www.mentor.com/
IEEE 1149.4 Working Group —
http://grouper.ieee.org/groups/1149/4/
Teradyne —
http://www.teradyne.com/atd
National Seconductor —
http://www.national.com/appinfo/scan
Altera —
http://www.altera.com/literature/an/an039.pdf
Our glance on the Test News Worldwide
You can found here links on the most interesting things, news and events
in the world of the Structural Test Industry: ICT, JTAG, DFT, and others.
Your
outlook
about this is very appreciated!
Expanded Role for JTAG DFT
Relationships key to boundary-scan success
Corelis Adds Capability to Directly Program Serial Bus I2C and SPI-based Devices
Analog Boundary-Scan Description Language (ABSDL) for Mixed-Signal Boards Test
Design-For-Testability Blog
The DFT Blog
Reuben Schrift’s paper on ICT in RoHS environment
Boundary-scan tools extend beyond basic PCB testing
Testability Management Action Group (TMAG)
New IEEE 1149.7 Test & Debug Standard Expands and Improves JTAG Functionality
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